An electron microscope (EM) uses a beam of electrons to magnify and image a sample. EM images have a higher resolution than light microscope images because electrons have a shorter wavelength.
Principles
- An electron source generates a stream of high-voltage electrons
- A vacuum accelerates the electrons toward the sample
- Metal apertures and magnetic lenses focus the electrons into a beam
- The beam is focused onto the sample
- The beam interacts with the sample, causing it to lose energy
- The lost energy is converted into other forms, such as heat, light, or X-rays
- The signals from these conversions are used to create an image of the sample
Types
- Transmission electron microscope (TEM): Passes electrons through a thin slice of the sample to reveal internal structures
- Scanning electron microscope (SEM): Scans the electron beam over the surface of the sample to reveal surface features
Applications
- Forensic analysis of unique samples
- Biomedical research to study cells, tissues, and organelles
- Industrial quality control and failure analysis
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